High-Definition Survey Data Used for 3D Retrofit Design Directly in AVEVA’s VANTAGE PDMS
Category: News
05.26.2005
ASPRS Releases Update to LAS Lidar Data Exchange Format Standard
ASPRS released version 1.1 of the ASPRS Lidar Data Exchange Format Standard (LAS) at its 71st Annual ASPRS Conference and Exhibition held in…
05.20.2005
Optech announces ILRIS Exchange Format (IXF)
Houston, May 23, 2005 Optech Incorporated, the global leader in the development and manufacture of advanced laser-based survey solutions, is pleased to announce…
05.20.2005
Optech announces shipments of ILRIS-36D have begun
Houston, May 23, 2005 Optech Incorporated, the global leader in the development and manufacture of advanced laser-based survey instruments, is pleased to announce…
05.18.2005
Release of New Leica CloudWorx 1.0 for Intergraph SmartPlant Review
First commercial application to put rich laser scanning as-built data directly in Intergraphs 3D plant design review environment
04.14.2005
TMS International Provides Major New Report on the Worldwide Market for LiDAR Systems and Services
Report Reviews Technologies, Service Providers and Trends in the Global Market
04.05.2005
Leica Geosystems Now Shipping High-Speed T-Scan Hand Scanner
Walk-around hand scanner expands measurement capabilities of LTD800 laser tracker
02.07.2005
Leica Geosystems Introduces the Leica DISTO Special5
Leica Geosystems AG, the inventor of the laser distance measuring devices, celebrates the 750,000th sold Leica DISTO with a special edition. The special…
02.02.2005
Optech Joins in the DARPA Grand Challenge 2005
Toronto, Ontario, February 1, 2005 Optech Incorporated, the global leader in the development and manufacture of laser-based survey instruments, has teamed with Team…
