Orlando, FL – October 7, 2019 – RIEGL will be attending, exhibiting, and presenting at the Americas Geospatial Forum 2019! The Americas Geospatial…
Author: RIEGL
RIEGL is Proud to Announce the NEW VQ-780 II
October 2, 2019 – This year at INTERGEO 2019 in Stuttgart, Germany, we announced many new and exciting instruments and LiDAR accessories that…
RIEGL to Attend and Exhibit at AREMA 2019
RIEGL will be attending and exhibiting at AREMA 2019! The AREMA 2019 exhibition will be taking place September 22-25, 2019 at the Minneapolis…
RIEGL’s James Van Rens Attends Meeting of the United Nations Global Geographic Information Management
August 16, 2019 – James Van Rens, Senior Vice President with RIEGL USA and Strategic Advisor for Government and Industry Relations for the…
James Van Rens Wins Presidential Award at MAPPS Summer Conference 2019
On Thursday, July 17th, 2019, James Van Rens, Senior Vice President with RIEGL USA and Strategic Advisor for Government and Industry Relations for…
RIEGL Invests in New Office and Production Facilities
New, additional facility expansions at the headquarters in Austria as well as a new facility in the United States.
Horn, July 15, 2019 – RIEGL, an internationally successful manufacturer of LiDAR scanners for surveying applications headquartered in Horn, Austria, is investing heavily…
RIEGL to Attend and Exhibit at Esri UC
RIEGL will be attending and exhibiting at Esri UC 2019! Esri UC 2019 will be taking place from July 8th-12th, 2019, at the…
Registration Now Open for RIEGL’s North America Training Symposium
Registration is now open for the 2019 RIEGL North America Training Symposium! The Training Symposium will be held October 14-17, 2019 at the…
RIEGL to Attend and Exhibit at SPAR 2019
RIEGL will be attending and exhibiting at SPAR 2019! SPAR 2019 will be taking place from May 21-23, 2019, at the Anaheim Convention…
RIEGL Will Be Exhibiting and Attending TUC 2019
May 1st, 2019 – TUC 2019 will take place from May 6th-9th, 2019, at UCF Rosen College in Orlando, Florida. RIEGL will be…